HIOKI Automatic Test Equipment (ATE)

Bare Board Testing

	FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781 1/2 Data Generation Time With New Platform   • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FLYING PROBE TESTER   FA1116 High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth   • Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement
	FAIL VISUALIZER   UA1782 Series Robust Support for Repair Work using Simple Operations and Assistive Functionality   • Dedicated visualization software for Hioki electrical testing equipment and data creation systems
	FLYING PROBE TESTER   FA1282 Robust Support for Testing Boards with Embedded Passive and Active Devices through High-Speed, Double-Sided Testing   • High-precision probing • Max.100 steps/s ultra-high speed inspection • Reliable clamping of thin boards
	BARE BOARD TESTER   FA1232 Robust Support for Testing Device Embedded Substrates
	BARE BOARD HiTESTER   1231 Semiconductor Package Board Testing System Utilizing Index Table Method   • Double-sided alignment and built-in handler
	BARE BOARD HiTESTER   1230 All-In-One Solution for Testing the Reliability of Connections on Printed Circuit Boards   •Emdedded passives/actives test •HDI via resistance •Known-good reference values for wiring pattern resistance
	X-Y BOARD HiTESTER   1270, 1271 Double-sided Board Tester with Maximum Measurement Speed of 0.012s/Step   • Double-sided bare board testing • 0.012s/step measurement speed

Populated Board Testing

	FAIL VISUALIZER   UA1782 Series Robust Support for Repair Work using Simple Operations and Assistive Functionality   • Dedicated visualization software for Hioki electrical testing equipment and data creation systems
	FLYING PROBE TESTER   FA1240,FA1241 Reduce Data Creation Time by a Factor of 10 and Slash Line Stoppage Time by a Factor of 15   • Quickly complete programs that take into account component height • Automatic calculation of arm interference
	IN-CIRCUIT HiTESTER   1220 High Performance Populated Board Testing with Expansion Capabilities   • 4-terminal testing • High-current/high-voltage diode testing • Impedance • High-speed testing of multi-board layouts
	X-Y IN-CIRCUIT HiTESTER   1240 Detection of IC lead pseudo-contact (poor contact) states

Data Creation Software

	FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781 1/2 Data Generation Time With New Platform   • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FIT-LINE INSPECTION DATA CREATION SYSTEM   UA1780 Data Creation System Delivers 90% Faster Data Generation, 93% Lower Line Stoppage Times   • Generate high-quality board testing data without physical boards